Testing Analogue Circuits by A C Power Supply Voltage

V
VLSID
1996
9th International Conference on VLSI Design: VLSI in Mobile Communication
Abstract - Testing Analogue Circuits by A C Power Supply Voltage

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	Similar Articles Articles by A.K. A. A'ain Articles by A. H. Bratt Articles by A. P. Dorey

9th International Conference on VLSI Design: VLSI in Mobile Communication

Bangalore, INDIA

January 03-January 06

ISBN: 0-8186-7228-5

	ASCII Text	x
	A.K. A. A'ain, A. H. Bratt, A. P. Dorey, "Testing Analogue Circuits by A C Power Supply Voltage," VLSI Design, International Conference on, pp. 238, 9th International Conference on VLSI Design: VLSI in Mobile Communication, 1996.

	BibTex	x
	@article{ 10.1109/ICVD.1996.489492, author = {A.K. A. A'ain and A. H. Bratt and A. P. Dorey}, title = {Testing Analogue Circuits by A C Power Supply Voltage}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {1996}, issn = {1063-9667}, pages = {238}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICVD.1996.489492}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - Testing Analogue Circuits by A C Power Supply Voltage SN - 1063-9667 SP EP A1 - A.K. A. A'ain, A1 - A. H. Bratt, A1 - A. P. Dorey, PY - 1996 KW - Fault model KW - analogue test KW - low voltage test VL - 0 JA - VLSI Design, International Conference on ER -

A.K. A. A'ain, Microelectronics Research Group, Engineering Department, Lancaster University, Lancaster, LA1 4YR, U. K

A. H. Bratt, Microelectronics Research Group, Engineering Department, Lancaster University, Lancaster, LA1 4YR, U. K

A. P. Dorey, Microelectronics Research Group, Engineering Department, Lancaster University, Lancaster, LA1 4YR, U. K

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICVD.1996.489492

This paper discusses the application of power supply voltage control testing technique for analogue circuits. It compares the fault coverage of voltage level and supply current monitoring schemes and proposes a technique to expose defects in redundants circuits that are very difficult to be exposed by using other testing techniques. It also discusses the effect in exposing defects by using different power supply frequency. Measurement and data analysis techniques to facilitate identification and classification between hard and soft defects are also proposed.

Index Terms:

Fault model, analogue test, low voltage test

Citation:

A.K. A. A'ain, A. H. Bratt, A. P. Dorey, "Testing Analogue Circuits by A C Power Supply Voltage," vlsid, pp.238, 9th International Conference on VLSI Design: VLSI in Mobile Communication, 1996

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