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9th International Conference on VLSI Design: VLSI in Mobile Communication
On More Efficient Combinational ATPG Using Functional Learning
Bangalore, INDIA
January 03-January 06
ISBN: 0-8186-7228-5
Learning techniques like SOCRATES and recursive learning have greatly enhanced the technology of FAPY-based ATPG. In this paper we present a test generation methodology for combinational circuits using functional learning, discuss application of novel functional information to enhance ATPG and present ATPG results on ISCAS 85 benchmark circuits. The test generation methodology combines the use of structural (topology) based analysis methods with the function representation techniques (such as BDDs). the use of structural (topology) based analysis methods with the function representation techniques (such as BDDs).
Citation:
R. Mukherjee, J. Jain, M. Fujita, J. A. Abraham, D. S. Fussell, "On More Efficient Combinational ATPG Using Functional Learning," vlsid, pp.107, 9th International Conference on VLSI Design: VLSI in Mobile Communication, 1996
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