Voting model based diagnosis of bridging faults in combinational circuits

V
VLSID
1995
8th International Conference on VLSI Design
Abstract - Voting model based diagnosis of bridging faults in combinational circuits

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8th International Conference on VLSI Design

New Delhi, India

January 04-January 07

ISBN: 0-8186-6905-5

	ASCII Text	x
	Sreejit Chakravarty, Y. Gong, "Voting model based diagnosis of bridging faults in combinational circuits," VLSI Design, International Conference on, pp. 338, 8th International Conference on VLSI Design, 1995.

	BibTex	x
	@article{ 10.1109/ICVD.1995.512135, author = {Sreejit Chakravarty and Y. Gong}, title = {Voting model based diagnosis of bridging faults in combinational circuits}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {1995}, isbn = {0-8186-6905-5}, pages = {338}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICVD.1995.512135}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - Voting model based diagnosis of bridging faults in combinational circuits SN - 0-8186-6905-5 SP EP A1 - Sreejit Chakravarty, A1 - Y. Gong, PY - 1995 KW - majority logic; combinational circuits; fault diagnosis; logic testing; MOS logic circuits; voting model based diagnosis; bridging faults; combinational circuits; diagnosis algorithm; fault list; stuck-at fault dictionary; compact data structure; fault dropping rules; time efficiency; space efficiency VL - 0 JA - VLSI Design, International Conference on ER -

Sreejit Chakravarty, Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA

Y. Gong, Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICVD.1995.512135

A novel algorithm for diagnosing bridging faults in combinational circuits is presented. The voting model is assumed. The diagnosis algorithm guarantees the "object bridging fault" (bridging fault in the circuit being diagnosed) to be in the final fault list. The novelties of the algorithm are: (i) unlike previous algorithms it does not use the full fault dictionary but uses portions of the stuck-at fault dictionary which is computed dynamically; (ii) it enumerates the faults implicitly using a compact data structure; and (iii) fault dropping rules, using stuck-at fault simulation only, are used. The resulting algorithm is both time and space efficient. Experimental evaluation of the algorithm is presented.

Index Terms:

majority logic; combinational circuits; fault diagnosis; logic testing; MOS logic circuits; voting model based diagnosis; bridging faults; combinational circuits; diagnosis algorithm; fault list; stuck-at fault dictionary; compact data structure; fault dropping rules; time efficiency; space efficiency

Citation:

Sreejit Chakravarty, Y. Gong, "Voting model based diagnosis of bridging faults in combinational circuits," vlsid, pp.338, 8th International Conference on VLSI Design, 1995

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