A highly testable ASIC for telephone signaling

V
VLSID
1995
8th International Conference on VLSI Design
Abstract - A highly testable ASIC for telephone signaling

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8th International Conference on VLSI Design

New Delhi, India

January 04-January 07

ISBN: 0-8186-6905-5

	ASCII Text	x
	P. Jayalakshmi, S. Vidya, S. Krishnakumar, K. Ravisankar, P. Kumar, "A highly testable ASIC for telephone signaling," VLSI Design, International Conference on, pp. 183, 8th International Conference on VLSI Design, 1995.

	BibTex	x
	@article{ 10.1109/ICVD.1995.512101, author = {P. Jayalakshmi and S. Vidya and S. Krishnakumar and K. Ravisankar and P. Kumar}, title = {A highly testable ASIC for telephone signaling}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {1995}, isbn = {0-8186-6905-5}, pages = {183}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICVD.1995.512101}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - A highly testable ASIC for telephone signaling SN - 0-8186-6905-5 SP EP A1 - P. Jayalakshmi, A1 - S. Vidya, A1 - S. Krishnakumar, A1 - K. Ravisankar, A1 - P. Kumar, PY - 1995 KW - application specific integrated circuits; telephone equipment; telephony; design for testability; integrated circuit design; telecommunication signalling; integrated circuit testing; digital integrated circuits; highly testable ASIC; telephone signaling; online system diagnostic functions; fault simulation; functional simulation VL - 0 JA - VLSI Design, International Conference on ER -

P. Jayalakshmi, Semicond. Complex Ltd., Bangalore, India

S. Vidya, Semicond. Complex Ltd., Bangalore, India

S. Krishnakumar, Semicond. Complex Ltd., Bangalore, India

K. Ravisankar, Semicond. Complex Ltd., Bangalore, India

P. Kumar, Semicond. Complex Ltd., Bangalore, India

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICVD.1995.512101

A highly testable ASIC for telephone signaling was developed by converting an existing card design into an ASIC. This paper details how the conversion of the design helped in introducing on-line system diagnostic functions. Also during this process various strategies had to be adopted to make the functional and fault simulation time efficient.

Index Terms:

application specific integrated circuits; telephone equipment; telephony; design for testability; integrated circuit design; telecommunication signalling; integrated circuit testing; digital integrated circuits; highly testable ASIC; telephone signaling; online system diagnostic functions; fault simulation; functional simulation

Citation:

P. Jayalakshmi, S. Vidya, S. Krishnakumar, K. Ravisankar, P. Kumar, "A highly testable ASIC for telephone signaling," vlsid, pp.183, 8th International Conference on VLSI Design, 1995

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