Generation of search state equivalence for automatic test pattern generation

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8th International Conference on VLSI Design

New Delhi, India

January 04-January 07

ISBN: 0-8186-6905-5

	ASCII Text	x
	Xinghao Chen, M.L. Bushnell, "Generation of search state equivalence for automatic test pattern generation," VLSI Design, International Conference on, pp. 99, 8th International Conference on VLSI Design, 1995.

	BibTex	x
	@article{ 10.1109/ICVD.1995.512085, author = {Xinghao Chen and M.L. Bushnell}, title = {Generation of search state equivalence for automatic test pattern generation}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {1995}, isbn = {0-8186-6905-5}, pages = {99}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICVD.1995.512085}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - Generation of search state equivalence for automatic test pattern generation SN - 0-8186-6905-5 SP EP A1 - Xinghao Chen, A1 - M.L. Bushnell, PY - 1995 KW - search problems; automatic testing; logic testing; sequential circuits; integrated circuit testing; search state equivalence; automatic test pattern generation; current search status; prior search decisions; previously-searched decision spaces; enabling theorem; sequential circuit test generation VL - 0 JA - VLSI Design, International Conference on ER -

Xinghao Chen, CAIP Center, Rutgers Univ., Piscataway, NJ, USA

M.L. Bushnell, CAIP Center, Rutgers Univ., Piscataway, NJ, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICVD.1995.512085

We present a generalization of the equivalent search state (EST) approach for test generation. A search state represents the current search status based on prior search decisions. The generalized EST identifies 56% more previously-searched decision spaces than its predecessor on the 1985 ISCAS benchmarks. We present the enabling theorem with a proof, results and an example for sequential circuit test generation.

Index Terms:

search problems; automatic testing; logic testing; sequential circuits; integrated circuit testing; search state equivalence; automatic test pattern generation; current search status; prior search decisions; previously-searched decision spaces; enabling theorem; sequential circuit test generation

Citation:

Xinghao Chen, M.L. Bushnell, "Generation of search state equivalence for automatic test pattern generation," vlsid, pp.99, 8th International Conference on VLSI Design, 1995

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