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16th IEEE International Conference on Tools with Artificial Intelligence (ICTAI'04)
An Information Retrieval System for the Analysis of Systematic Defects in VLSI
Boca Raton, Florida
November 15-November 17
ISBN: 0-7695-2236-X
ASCII Text
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David L. DeMaris, Dan Maynard, Bette Bergman Reuter, Shi Zhong, "An Information Retrieval System for the Analysis of Systematic Defects in VLSI," Tools with Artificial Intelligence, IEEE International Conference on, pp. 216-223, 16th IEEE International Conference on Tools with Artificial Intelligence (ICTAI'04), 2004.
 
 
BibTex
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@article{ 10.1109/ICTAI.2004.31,
author = {David L. DeMaris and Dan Maynard and Bette Bergman Reuter and Shi Zhong},
title = {An Information Retrieval System for the Analysis of Systematic Defects in VLSI},
journal ={Tools with Artificial Intelligence, IEEE International Conference on},
volume = {0},
year = {2004},
issn = {1082-3409},
pages = {216-223},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICTAI.2004.31},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Tools with Artificial Intelligence, IEEE International Conference on
TI - An Information Retrieval System for the Analysis of Systematic Defects in VLSI
SN - 1082-3409
SP216
EP223
A1 - David L. DeMaris,
A1 - Dan Maynard,
A1 - Bette Bergman Reuter,
A1 - Shi Zhong,
PY - 2004
KW - null
VL - 0
JA - Tools with Artificial Intelligence, IEEE International Conference on
ER -
 
Dan Maynard, IBM Microelectronics
Bette Bergman Reuter, IBM Microelectronics
Shi Zhong, Florida Atlantic University
This paper presents a novel information retrieval (IR) tool, designed to help VLSI defect and yield engineers identify potentially defective layout regions. Given a query defect pattern discovered in a manufacturing process, this tool can be used to return similar layout regions in one or more designs ranked by similarity to the query pattern. Defect engineers can then examine these regions in hardware for presence of defects to analyze the cause of the failure. Detailed design considerations, such as feature extraction and clustered search, as well as some real-world search results, are presented and discussed.
Citation:
David L. DeMaris, Dan Maynard, Bette Bergman Reuter, Shi Zhong, "An Information Retrieval System for the Analysis of Systematic Defects in VLSI," ictai, pp.216-223, 16th IEEE International Conference on Tools with Artificial Intelligence (ICTAI'04), 2004
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