In the field of 3-D image measurement, a technique based on stripe pattern projection and observation image intensity analysis is expected to be able to detect several stripes by a single projection. It is necessary to increase the stripe number of the projection pattern in order to improve the measurement accuracy of depth distance. However, when the stripe number is increased, the difference of the intensity between stripes will be reduced and stripe detection will become difficult. In order to improve the detection accuracy of the stripe order and shorten the 3-D measurement time, we use the Optimal Intensity-Modulation Projection (OIMP) technique, and in order to improve the depth distance measurement accuracy, we propose an Intensity-Phase Analysis (IPA) technique. In the proposed IPA technique, the observation pattern be segmented by the intensity of the intensity-modulated stripe, and in every segmentation the depth distance of all pixels are obtained by phase analysis. By using a combination of the OIMP and IPA techniques, high-speed (single projection and double image captures) and high-accuracy (error less than 0.1%) practical 3-D shape measurement can be realized.