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18th International Conference on Pattern Recognition (ICPR'06) Volume 2
Invariant Ridgelet-Fourier Descriptor for Pattern Recognition
Hong Kong
August 20-August 24
ISBN: 0-7695-2521-0
G. Y. Chen, Concordia University
T. D. Bui, Concordia University
A. Krzyzak, Concordia University
In this paper, we present a novel descriptor for feature extraction by using a combination of ridgelets and Fourier transform. We have successfully implemented ridgelets on the circular disk containing the pattern and applied Fourier transform on the resulting ridgelet coefficients to extract rotation-invariant features for pattern recognition. The descriptor is very robust to Gaussian noise even when the noise level is high. Experimental results show that the new descriptor is a very good choice for pattern recognition.
Citation:
G. Y. Chen, T. D. Bui, A. Krzyzak, "Invariant Ridgelet-Fourier Descriptor for Pattern Recognition," icpr, vol. 2, pp.768-771, 18th International Conference on Pattern Recognition (ICPR'06) Volume 2, 2006
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