loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
18th International Conference on Pattern Recognition (ICPR'06) Volume 2
Image Complexity and Feature Extraction for Steganalysis of LSB Matching Steganography
Hong Kong
August 20-August 24
ISBN: 0-7695-2521-0
Qingzhong Liu, New Mexico Tech
Andrew H. Sung, New Mexico Tech
Jianyun Xu, Microsoft Corporation One Microsoft Way Redmond, WA
Bernardete M. Ribeiro, University of Coimbra, Portugal
In this paper, we present a scheme for steganalysis of LSB matching steganography based on feature extraction and pattern recognition techniques. Shape parameter of Generalized Gaussian Distribution (GGD) in the wavelet domain is introduced to measure image complexity. Several statistical pattern recognition algorithms are applied to train and classify the feature sets. Comparison of our method and others indicates our method is highly competitive. It is highly efficient for color image steganalysis. It is also efficient for grayscale steganalysis in the low image complexity domain.
Citation:
Qingzhong Liu, Andrew H. Sung, Jianyun Xu, Bernardete M. Ribeiro, "Image Complexity and Feature Extraction for Steganalysis of LSB Matching Steganography," icpr, vol. 2, pp.267-270, 18th International Conference on Pattern Recognition (ICPR'06) Volume 2, 2006
Usage of this product signifies your acceptance of the Terms of Use.