18th International Conference on Pattern Recognition (ICPR'06) Volume 3 A fast binary-image comparison method with local-dissimilarity quantification Hong Kong August 20-August 24 ISBN: 0-7695-2521-0
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICPR.2006.63
Image similarity measure is widely used in image processing. For binary images that are not composed of a single shape, a local comparison is interesting but the features are usely poor (color) or difficult to extract (texture, forms). We present a new binary image comparison method that uses a windowed Hausdorff distance in a pixel-adaptive way. It enables to quantify the local dissimilarities and to give their spatial distribution which greatly improve the dissimilarity information. Combined with a Support Vector Machine classifier, this method is successfully tested on an medieval-impression database.
Citation:
Etienne Baudrier, Gilles Millon, Frederic Nicolier, Su Ruan, "A fast binary-image comparison method with local-dissimilarity quantification," icpr, vol. 3, pp.216-219, 18th International Conference on Pattern Recognition (ICPR'06) Volume 3, 2006 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||