18th International Conference on Pattern Recognition (ICPR'06) Volume 3
A fast binary-image comparison method with local-dissimilarity quantification
Hong Kong
August 20-August 24
ISBN: 0-7695-2521-0
Etienne Baudrier, Laboratoire CReSTIC, IUT de Troyes, 9, rue de Qu?ebec, 10026 TROYES CEDEX, France
Gilles Millon, Laboratoire CReSTIC, IUT de Troyes, 9, rue de Qu?ebec, 10026 TROYES CEDEX, France
Frederic Nicolier, Laboratoire CReSTIC, IUT de Troyes, 9, rue de Qu?ebec, 10026 TROYES CEDEX, France
Su Ruan, Laboratoire CReSTIC, IUT de Troyes, 9, rue de Qu?ebec, 10026 TROYES CEDEX, France
Image similarity measure is widely used in image processing. For binary images that are not composed of a single shape, a local comparison is interesting but the features are usely poor (color) or difficult to extract (texture, forms). We present a new binary image comparison method that uses a windowed Hausdorff distance in a pixel-adaptive way. It enables to quantify the local dissimilarities and to give their spatial distribution which greatly improve the dissimilarity information. Combined with a Support Vector Machine classifier, this method is successfully tested on an medieval-impression database.
Citation:
Etienne Baudrier, Gilles Millon, Frederic Nicolier, Su Ruan, "A fast binary-image comparison method with local-dissimilarity quantification," icpr, vol. 3, pp.216-219, 18th International Conference on Pattern Recognition (ICPR'06) Volume 3, 2006