loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
18th International Conference on Pattern Recognition (ICPR'06) Volume 2
Fast Linear Discriminant Analysis Using Binary Bases
Hong Kong
August 20-August 24
ISBN: 0-7695-2521-0
Feng Tang, University of California, Santa Cruz, USA
Hai Tao, University of California, Santa Cruz, USA
Linear Discriminant Analysis (LDA) is a widely used technique for pattern classification. It seeks the linear projection of the data to a low dimensional subspace where the data features can be modelled with maximal discriminative power. The main computation involved in LDA is the dot product between LDA base vector and the data which is costly element-wise floating point multiplications. In this paper, we present a fast linear discriminant analysis method called binary LDA, which possesses the desirable property that the subspace projection operation can be computed very efficiently. We investigate the LDA guided non-orthogonal binary subspace method to find the binary LDA bases, each of which is a linear combination of a small number of Haar-like box functions. The proposed approach is applied to face recognition. Experiments show that the discriminative power of binary LDA is preserved and the projection computation is significantly reduced.
Citation:
Feng Tang, Hai Tao, "Fast Linear Discriminant Analysis Using Binary Bases," icpr, vol. 2, pp.52-55, 18th International Conference on Pattern Recognition (ICPR'06) Volume 2, 2006
Usage of this product signifies your acceptance of the Terms of Use.