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18th International Conference on Pattern Recognition (ICPR'06) Volume 2
FAIR: Towards A New Feature for Affinely-Invariant Recognition
Hong Kong
August 20-August 24
ISBN: 0-7695-2521-0
Radim Sara, Czech Technical University
Martin Matousek, Czech Technical University
In this paper we propose the first version of FAIR, a low-dimensional image neighborhood descriptor that shows performance comparable to SIFT introduced by Lowe. The dimension of FAIR we tested is 30, compared to the dimension of 128 in SIFT. Sensitivity of the FAIR descriptor to skew, rotation, image blur and noise is similar to SIFT. FAIR shows better localization in scale-space than SIFT. Several extensions of FAIR that could improve its performance are discussed.
Citation:
Radim Sara, Martin Matousek, "FAIR: Towards A New Feature for Affinely-Invariant Recognition," icpr, vol. 2, pp.412-416, 18th International Conference on Pattern Recognition (ICPR'06) Volume 2, 2006
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