Extraction of Consistent Subsets of Descriptors using Choquet Integral

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	Similar Articles Articles by Jan Rendek Articles by Laurent Wendling

18th International Conference on Pattern Recognition (ICPR'06) Volume 3

Hong Kong

August 20-August 24

ISBN: 0-7695-2521-0

	ASCII Text	x
	Jan Rendek, Laurent Wendling, "Extraction of Consistent Subsets of Descriptors using Choquet Integral," Pattern Recognition, International Conference on, vol. 3, pp. 208-211, 18th International Conference on Pattern Recognition (ICPR'06) Volume 3, 2006.

	BibTex	x
	@article{ 10.1109/ICPR.2006.521, author = {Jan Rendek and Laurent Wendling}, title = {Extraction of Consistent Subsets of Descriptors using Choquet Integral}, journal ={Pattern Recognition, International Conference on}, volume = {3}, year = {2006}, issn = {1051-4651}, pages = {208-211}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2006.521}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Pattern Recognition, International Conference on TI - Extraction of Consistent Subsets of Descriptors using Choquet Integral SN - 1051-4651 SP208 EP211 A1 - Jan Rendek, A1 - Laurent Wendling, PY - 2006 KW - null VL - 3 JA - Pattern Recognition, International Conference on ER -

Jan Rendek, France Telecom R&D and LORIA, CEDEX, France

Laurent Wendling, LORIA-Universite de Nancy I, CEDEX, France

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICPR.2006.521

This paper presents a novel approach to automatically extract a subset of shape descriptors dedicated to an application under consideration. Basic descriptors having low time processing and allowing to keep nice geometric properties were implemented. Then a model based on Choquet integral and Shapley values, is proposed to select suitable descriptors. Experimental studies using real databases attest of the robustness of our approach.

Citation:

Jan Rendek, Laurent Wendling, "Extraction of Consistent Subsets of Descriptors using Choquet Integral," icpr, vol. 3, pp.208-211, 18th International Conference on Pattern Recognition (ICPR'06) Volume 3, 2006

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