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18th International Conference on Pattern Recognition (ICPR'06) Volume 1
Characteristic Line of Planar Homography Matrix and Its Applications in Camera Calibration
Hong Kong
August 20-August 24
ISBN: 0-7695-2521-0
Jianhua Wang, Shanghai Jiao Tong University
Yuncai Liu, Shanghai Jiao Tong University
In this paper, we employ the concept of characteristic line to show some useful properties of planar homography matrix. These properties relate the characteristic line of a planar homography matrix with Euler angles of the planar pattern. Based on the characteristic line, a new method of linear camera calibration is proposed and a strategy to select poses of planar pattern during taking calibration images is suggested. This strategy can help ensure accuracy of calibration. Experiment results including both simulated data and real images validate the method and strategy.
Citation:
Jianhua Wang, Yuncai Liu, "Characteristic Line of Planar Homography Matrix and Its Applications in Camera Calibration," icpr, vol. 1, pp.147-150, 18th International Conference on Pattern Recognition (ICPR'06) Volume 1, 2006
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