18th International Conference on Pattern Recognition (ICPR'06) Volume 1 Characteristic Line of Planar Homography Matrix and Its Applications in Camera Calibration Hong Kong August 20-August 24 ISBN: 0-7695-2521-0
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICPR.2006.363
In this paper, we employ the concept of characteristic line to show some useful properties of planar homography matrix. These properties relate the characteristic line of a planar homography matrix with Euler angles of the planar pattern. Based on the characteristic line, a new method of linear camera calibration is proposed and a strategy to select poses of planar pattern during taking calibration images is suggested. This strategy can help ensure accuracy of calibration. Experiment results including both simulated data and real images validate the method and strategy.
Citation:
Jianhua Wang, Yuncai Liu, "Characteristic Line of Planar Homography Matrix and Its Applications in Camera Calibration," icpr, vol. 1, pp.147-150, 18th International Conference on Pattern Recognition (ICPR'06) Volume 1, 2006 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||