18th International Conference on Pattern Recognition (ICPR'06) Volume 3 Blind Image Steganalysis Based on Statistical Analysis of Empirical Matrix Hong Kong August 20-August 24 ISBN: 0-7695-2521-0
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICPR.2006.332
In this paper, a novel steganalysis method based on statistical analysis of empirical matrix (EM) is proposed to detect the presence of hidden message in an image. The projection histogram ..PH.. of EM is used to extract features composed of two parts: the moments of PH and the moments of the characteristic function of PH. Also, features extracted from prediction-error image [7] are included to enhance performance. SVM is utilized as classifier. A test database is constructed, based on which a detailed test for different categories of features and a comparison with methods in prior arts are conducted. Experiments show that the features we proposed are more effective than prior arts and our steganalysis method could blindly detect the presence of data hiding for various embedding schemes with high performance.
Citation:
Xiaochuan Chen, Yunhong Wang, Tieniu Tan, Lei Guo, "Blind Image Steganalysis Based on Statistical Analysis of Empirical Matrix," icpr, vol. 3, pp.1107-1110, 18th International Conference on Pattern Recognition (ICPR'06) Volume 3, 2006 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||