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18th International Conference on Pattern Recognition (ICPR'06) Volume 3
An Efficient Algorithm for Point Matching Using Hilbert Scanning Distance
Hong Kong
August 20-August 24
ISBN: 0-7695-2521-0
ASCII Text
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Li Tian, Sei-ichiro Kamata, "An Efficient Algorithm for Point Matching Using Hilbert Scanning Distance," Pattern Recognition, International Conference on, vol. 3, pp. 873-876, 18th International Conference on Pattern Recognition (ICPR'06) Volume 3, 2006.
 
 
BibTex
x
 
@article{ 10.1109/ICPR.2006.237,
author = {Li Tian and Sei-ichiro Kamata},
title = {An Efficient Algorithm for Point Matching Using Hilbert Scanning Distance},
journal ={Pattern Recognition, International Conference on},
volume = {3},
year = {2006},
issn = {1051-4651},
pages = {873-876},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2006.237},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Pattern Recognition, International Conference on
TI - An Efficient Algorithm for Point Matching Using Hilbert Scanning Distance
SN - 1051-4651
SP873
EP876
A1 - Li Tian,
A1 - Sei-ichiro Kamata,
PY - 2006
KW - null
VL - 3
JA - Pattern Recognition, International Conference on
ER -
 
Li Tian, Waseda University, Japan
Sei-ichiro Kamata, Waseda University, Japan
A fast and accurate similarity named Hilbert Scanning Distance(HSD) [9] has recently been presented for point matching. In this study, we improved an efficient algorithm of search strategy for HSD in the large search space. This search strategy is associated with two ideas: a relaxation greedy search, and an accelerating process using Monte Carlo sampling. The experimental results implicate that this improved algorithm is robust and efficient for point matching using HSD. It also makes a tradeoff between accuracy and speed under different requirements.
Citation:
Li Tian, Sei-ichiro Kamata, "An Efficient Algorithm for Point Matching Using Hilbert Scanning Distance," icpr, vol. 3, pp.873-876, 18th International Conference on Pattern Recognition (ICPR'06) Volume 3, 2006
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