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18th International Conference on Pattern Recognition (ICPR'06) Volume 2
A Unified Strategy to Deal with Different Natures of Reject
Hong Kong
August 20-August 24
ISBN: 0-7695-2521-0
ASCII Text
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Harold Mouchere, Eric Anquetil, "A Unified Strategy to Deal with Different Natures of Reject," Pattern Recognition, International Conference on, vol. 2, pp. 792-795, 18th International Conference on Pattern Recognition (ICPR'06) Volume 2, 2006.
 
 
BibTex
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@article{ 10.1109/ICPR.2006.193,
author = {Harold Mouchere and Eric Anquetil},
title = {A Unified Strategy to Deal with Different Natures of Reject},
journal ={Pattern Recognition, International Conference on},
volume = {2},
year = {2006},
issn = {1051-4651},
pages = {792-795},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2006.193},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Pattern Recognition, International Conference on
TI - A Unified Strategy to Deal with Different Natures of Reject
SN - 1051-4651
SP792
EP795
A1 - Harold Mouchere,
A1 - Eric Anquetil,
PY - 2006
VL - 2
JA - Pattern Recognition, International Conference on
ER -
 
Harold Mouchere, IRISA / 1,2INSA / 1CNRS Campus Universitaire de Beaulieu, France
Eric Anquetil, IRISA / 1,2INSA / 1CNRS Campus Universitaire de Beaulieu, France
The interest of reject for classifier optimization has been shown many times. The diversity of the applications requiring this concept makes us to distinguish two main natures of reject with distinct goals: the confusion reject and the distance reject. After the description of this two kinds of reject, we present a unified formalism to define them using reliability functions and reject thresholds. Then we present a generic algorithm dedicated to the automatic learning of these thresholds. Finally, we compare various possibilities of reject to achieve application goals.
Citation:
Harold Mouchere, Eric Anquetil, "A Unified Strategy to Deal with Different Natures of Reject," icpr, vol. 2, pp.792-795, 18th International Conference on Pattern Recognition (ICPR'06) Volume 2, 2006
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