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18th International Conference on Pattern Recognition (ICPR'06) Volume 1
A New Structural Constraint and its Application in Wide Baseline Matching
Hong Kong
August 20-August 24
ISBN: 0-7695-2521-0
X. Lu, University of California, Santa Cruz
R. Manduchi, University of California, Santa Cruz
We introduce a new structural constraint that can be used for matching points in image pairs taken from a wide baseline. No assumption is made about the geometry of the 3D points or of surfaces in the scene, nor about the location or orientation of the cameras. This structural constraint can be used to reduce the search space when matching a number of feature points in two images, eliminating the risk of selecting a matching that is provably wrong because unrealizable.
Citation:
X. Lu, R. Manduchi, "A New Structural Constraint and its Application in Wide Baseline Matching," icpr, vol. 1, pp.84-89, 18th International Conference on Pattern Recognition (ICPR'06) Volume 1, 2006
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