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18th International Conference on Pattern Recognition (ICPR'06) Volume 3
A new method to detect arcs and segments from curvature profiles
Hong Kong
August 20-August 24
ISBN: 0-7695-2521-0
ASCII Text
x 
 
J.-P. Salmon, I. Debled-Rennesson, L. Wendling, "A new method to detect arcs and segments from curvature profiles," Pattern Recognition, International Conference on, vol. 3, pp. 387-390, 18th International Conference on Pattern Recognition (ICPR'06) Volume 3, 2006.
 
 
BibTex
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@article{ 10.1109/ICPR.2006.123,
author = {J.-P. Salmon and I. Debled-Rennesson and L. Wendling},
title = {A new method to detect arcs and segments from curvature profiles},
journal ={Pattern Recognition, International Conference on},
volume = {3},
year = {2006},
issn = {1051-4651},
pages = {387-390},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2006.123},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Pattern Recognition, International Conference on
TI - A new method to detect arcs and segments from curvature profiles
SN - 1051-4651
SP387
EP390
A1 - J.-P. Salmon,
A1 - I. Debled-Rennesson,
A1 - L. Wendling,
PY - 2006
KW - null
VL - 3
JA - Pattern Recognition, International Conference on
ER -
 
J.-P. Salmon, LORIA, Campus scientifique, BP 239, Vandoeuvre-les-Nancy Cedex France
I. Debled-Rennesson, LORIA, Campus scientifique, BP 239, Vandoeuvre-les-Nancy Cedex France
L. Wendling, LORIA, Campus scientifique, BP 239, Vandoeuvre-les-Nancy Cedex France
In this paper a new method of arc detection based on arithmetic discrete lines is presented. Key points are extracted from such a profile and used for the reconstruction. The used method is fast and easy to implement. Experimental studies on several series of test images show the stability and the robustness of the proposed method.
Citation:
J.-P. Salmon, I. Debled-Rennesson, L. Wendling, "A new method to detect arcs and segments from curvature profiles," icpr, vol. 3, pp.387-390, 18th International Conference on Pattern Recognition (ICPR'06) Volume 3, 2006
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