Four Metrics for Efficiently Comparing Attributed Trees

I
ICPR
2004
17th International Conference on Pattern Recognition (ICPR'04) - Volume 2
Abstract - Four Metrics for Efficiently Comparing Attributed Trees

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17th International Conference on Pattern Recognition (ICPR'04) - Volume 2

Cambridge UK

August 23-August 26

ISBN: 0-7695-2128-2

	ASCII Text	x
	Andrea Torsello, Dzena Hidovic, Marcello Pelillo, "Four Metrics for Efficiently Comparing Attributed Trees," Pattern Recognition, International Conference on, vol. 2, pp. 467-470, 17th International Conference on Pattern Recognition (ICPR'04) - Volume 2, 2004.

	BibTex	x
	@article{ 10.1109/ICPR.2004.1334263, author = {Andrea Torsello and Dzena Hidovic and Marcello Pelillo}, title = {Four Metrics for Efficiently Comparing Attributed Trees}, journal ={Pattern Recognition, International Conference on}, volume = {2}, year = {2004}, issn = {1051-4651}, pages = {467-470}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2004.1334263}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Pattern Recognition, International Conference on TI - Four Metrics for Efficiently Comparing Attributed Trees SN - 1051-4651 SP467 EP470 A1 - Andrea Torsello, A1 - Dzena Hidovic, A1 - Marcello Pelillo, PY - 2004 KW - null VL - 2 JA - Pattern Recognition, International Conference on ER -

Andrea Torsello, Universit? Ca' Foscari di Venezia, Italy

Dzena Hidovic, University of Birmingham, UK

Marcello Pelillo, Universit? Ca' Foscari di Venezia, Italy

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICPR.2004.1334263

We address the problem of comparing attributed trees and propose four novel distance metrics centered around the notion of a maximal similarity common subtree, and hence can be computed in polynomial time. We experimentally validate the usefulness of our metrics on shape matching tasks, and compare them with edit-distance.

Citation:

Andrea Torsello, Dzena Hidovic, Marcello Pelillo, "Four Metrics for Efficiently Comparing Attributed Trees," icpr, vol. 2, pp.467-470, 17th International Conference on Pattern Recognition (ICPR'04) - Volume 2, 2004

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