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16th International Conference on Pattern Recognition (ICPR'02) - Volume 2
Recent Trends in 2D Blind Deconvolution for Nondestructive Evaluation
Quebec City, QC, Canada
August 11-August 15
ISBN: 0-7695-1695-X
ASCII Text
x 
 
Chi- Hau Chen, Uvais Qidwai, "Recent Trends in 2D Blind Deconvolution for Nondestructive Evaluation," Pattern Recognition, International Conference on, vol. 2, pp. 20989, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 2, 2002.
 
 
BibTex
x
 
@article{ 10.1109/ICPR.2002.1048472,
author = {Chi- Hau Chen and Uvais Qidwai},
title = {Recent Trends in 2D Blind Deconvolution for Nondestructive Evaluation},
journal ={Pattern Recognition, International Conference on},
volume = {2},
year = {2002},
issn = {1051-4651},
pages = {20989},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2002.1048472},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Pattern Recognition, International Conference on
TI - Recent Trends in 2D Blind Deconvolution for Nondestructive Evaluation
SN - 1051-4651
SP
EP
A1 - Chi- Hau Chen,
A1 - Uvais Qidwai,
PY - 2002
KW - null
VL - 2
JA - Pattern Recognition, International Conference on
ER -
 
Chi- Hau Chen, University of Massachusetts at Dartmouth
Uvais Qidwai, Tulane University
Ultrasonic imaging for nondestructive evaluation (NDE) applications is an important process for industrial applications. Such images are constrained by the sensor positions and indirect image formation. In this paper, some recent techniques in the areas of ultrasonic image enhancement and restoration, developed by the authors, are presented. Three new approaches have been presented to enhance the ultrasonic images with minimum or no information of the distortion function or the imaging system characteristics.
Citation:
Chi- Hau Chen, Uvais Qidwai, "Recent Trends in 2D Blind Deconvolution for Nondestructive Evaluation," icpr, vol. 2, pp.20989, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 2, 2002
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