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16th International Conference on Pattern Recognition (ICPR'02) - Volume 2
Affine Parameter Estimation from the Trace Transform
Quebec City, QC, Canada
August 11-August 15
ISBN: 0-7695-1695-X
ASCII Text
x 
 
Alexander Kadyrov, Maria Petrou, "Affine Parameter Estimation from the Trace Transform," Pattern Recognition, International Conference on, vol. 2, pp. 20798, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 2, 2002.
 
 
BibTex
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@article{ 10.1109/ICPR.2002.1048423,
author = {Alexander Kadyrov and Maria Petrou},
title = {Affine Parameter Estimation from the Trace Transform},
journal ={Pattern Recognition, International Conference on},
volume = {2},
year = {2002},
issn = {1051-4651},
pages = {20798},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2002.1048423},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Pattern Recognition, International Conference on
TI - Affine Parameter Estimation from the Trace Transform
SN - 1051-4651
SP
EP
A1 - Alexander Kadyrov,
A1 - Maria Petrou,
PY - 2002
KW - null
VL - 2
JA - Pattern Recognition, International Conference on
ER -
 
Alexander Kadyrov, University of Surrey
Maria Petrou, University of Surrey
In this paper we assume that we are given two images, one of which is an affine version of the other, and present a way of computing the parameters of the affine transform between the two images. We present a generic theoretical framework in terms of which other proposed methods can be interpreted, and show how in this framework one can recover the affine parameters in a way that is robust to various effects, like occlusion and illumination variation.
Citation:
Alexander Kadyrov, Maria Petrou, "Affine Parameter Estimation from the Trace Transform," icpr, vol. 2, pp.20798, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 2, 2002
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