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16th International Conference on Pattern Recognition (ICPR'02) - Volume 2
Fusion of Global and Local Features for Face Verification
Quebec City, QC, Canada
August 11-August 15
ISBN: 0-7695-1695-X
ASCII Text
x 
 
Yuchun Fang, Tieniu Tan, Yunhong Wang, "Fusion of Global and Local Features for Face Verification," Pattern Recognition, International Conference on, vol. 2, pp. 20382, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 2, 2002.
 
 
BibTex
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@article{ 10.1109/ICPR.2002.1048319,
author = {Yuchun Fang and Tieniu Tan and Yunhong Wang},
title = {Fusion of Global and Local Features for Face Verification},
journal ={Pattern Recognition, International Conference on},
volume = {2},
year = {2002},
issn = {1051-4651},
pages = {20382},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2002.1048319},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Pattern Recognition, International Conference on
TI - Fusion of Global and Local Features for Face Verification
SN - 1051-4651
SP
EP
A1 - Yuchun Fang,
A1 - Tieniu Tan,
A1 - Yunhong Wang,
PY - 2002
KW - null
VL - 2
JA - Pattern Recognition, International Conference on
ER -
 
Yuchun Fang, Chinese Academy of Sciences
Tieniu Tan, Chinese Academy of Sciences
Yunhong Wang, Chinese Academy of Sciences
In this paper, a novel personalized feature combination scheme is proposed for face verification. ANFIS (Adaptive Neuro-Fuzzy Inference System) and SVM (Support Vector Machine) are adopted respectively to form specialized feature representation for each subject by fusing global and local features. Instead of the common way for different subjects, we realize a new representation that adapts to each individual. Such adaptability in feature selection is inspired by face recognition in the HVS (Human Visual System) and results in an improved recognition rate.
Citation:
Yuchun Fang, Tieniu Tan, Yunhong Wang, "Fusion of Global and Local Features for Face Verification," icpr, vol. 2, pp.20382, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 2, 2002
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