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16th International Conference on Pattern Recognition (ICPR'02) - Volume 2
Analysis of Error-Reject Trade-off in Linearly Combined Classifiers
Quebec City, QC, Canada
August 11-August 15
ISBN: 0-7695-1695-X
ASCII Text
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Fabio Roli, Giorgio Fumera, Gianni Vernazza, "Analysis of Error-Reject Trade-off in Linearly Combined Classifiers," Pattern Recognition, International Conference on, vol. 2, pp. 20120, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 2, 2002.
 
 
BibTex
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@article{ 10.1109/ICPR.2002.1048252,
author = {Fabio Roli and Giorgio Fumera and Gianni Vernazza},
title = {Analysis of Error-Reject Trade-off in Linearly Combined Classifiers},
journal ={Pattern Recognition, International Conference on},
volume = {2},
year = {2002},
issn = {1051-4651},
pages = {20120},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2002.1048252},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Pattern Recognition, International Conference on
TI - Analysis of Error-Reject Trade-off in Linearly Combined Classifiers
SN - 1051-4651
SP
EP
A1 - Fabio Roli,
A1 - Giorgio Fumera,
A1 - Gianni Vernazza,
PY - 2002
KW - null
VL - 2
JA - Pattern Recognition, International Conference on
ER -
 
Fabio Roli, University of Cagliari
Giorgio Fumera, University of Cagliari
Gianni Vernazza, University of Genova
In this paper, a framework for the analysis of the error-reject trade-off in linearly combined classifiers is proposed. We start from a framework developed by Tumer and Ghosh [1, 2]. We extend this framework and analyse some hypotheses under which the linear combination of classifier outputs can improve the error-reject trade-off of the individual classifiers. Experiments that support some of the analytical results are reported.
Citation:
Fabio Roli, Giorgio Fumera, Gianni Vernazza, "Analysis of Error-Reject Trade-off in Linearly Combined Classifiers," icpr, vol. 2, pp.20120, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 2, 2002
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