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16th International Conference on Pattern Recognition (ICPR'02) - Volume 2
Style-Conscious Quadratic Field Classifier
Quebec City, QC, Canada
August 11-August 15
ISBN: 0-7695-1695-X
Sriharsha Veeramachaneni, Rensselaer Polytechnic Institute
Hiromichi Fujisawa, Hitachi Central Research Laboratory
Cheng-Lin Liu, Hitachi Central Research Laboratory
George Nagy, Rensselaer Polytechnic Institute
When patterns occur in the form of groups generated by the same source, distinctions between sources can be exploited to improve accuracy. We present a method for exploiting such ?style? consistency using a quadratic discriminant. We show that under reasonable assumptions on the feature and class distributions, the estimation of style parameters is simple and accurate, therefore style constrained classification deserves further attention.
Citation:
Sriharsha Veeramachaneni, Hiromichi Fujisawa, Cheng-Lin Liu, George Nagy, "Style-Conscious Quadratic Field Classifier," icpr, vol. 2, pp.20072, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 2, 2002
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