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16th International Conference on Pattern Recognition (ICPR'02) - Volume 3
Mutual Information Based Evaluation of 3D Building Models
Quebec City, QC, Canada
August 11-August 15
ISBN: 0-7695-1695-X
ASCII Text
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Ildiko Suveg, George Vosselman, "Mutual Information Based Evaluation of 3D Building Models," Pattern Recognition, International Conference on, vol. 3, pp. 30557, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 3, 2002.
 
 
BibTex
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@article{ 10.1109/ICPR.2002.1048000,
author = {Ildiko Suveg and George Vosselman},
title = {Mutual Information Based Evaluation of 3D Building Models},
journal ={Pattern Recognition, International Conference on},
volume = {3},
year = {2002},
issn = {1051-4651},
pages = {30557},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2002.1048000},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Pattern Recognition, International Conference on
TI - Mutual Information Based Evaluation of 3D Building Models
SN - 1051-4651
SP
EP
A1 - Ildiko Suveg,
A1 - George Vosselman,
PY - 2002
KW - null
VL - 3
JA - Pattern Recognition, International Conference on
ER -
 
Ildiko Suveg, Delft University of Technology
George Vosselman, Delft University of Technology

This paper presents a metric based on information theory principles that compares 3D object models to images. The metric is based on the formulation of the mutual information between the model and the images. The technique does not require a priori information about the surface properties of the object and is robust with respect to variations of illumination. As result the method is quite general and may be used in a wide variety of applications.

Experiments are presented that demonstrate the approach by evaluating reconstructed 3D building models in aerial images.

Citation:
Ildiko Suveg, George Vosselman, "Mutual Information Based Evaluation of 3D Building Models," icpr, vol. 3, pp.30557, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 3, 2002
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