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16th International Conference on Pattern Recognition (ICPR'02) - Volume 3
DVHMM: Variable Length Text Recognition Error Model
Quebec City, QC, Canada
August 11-August 15
ISBN: 0-7695-1695-X
ASCII Text
x 
 
Atsuhiro Takasu, Kenro Aihara, "DVHMM: Variable Length Text Recognition Error Model," Pattern Recognition, International Conference on, vol. 3, pp. 30110, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 3, 2002.
 
 
BibTex
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@article{ 10.1109/ICPR.2002.1047807,
author = {Atsuhiro Takasu and Kenro Aihara},
title = {DVHMM: Variable Length Text Recognition Error Model},
journal ={Pattern Recognition, International Conference on},
volume = {3},
year = {2002},
issn = {1051-4651},
pages = {30110},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2002.1047807},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Pattern Recognition, International Conference on
TI - DVHMM: Variable Length Text Recognition Error Model
SN - 1051-4651
SP
EP
A1 - Atsuhiro Takasu,
A1 - Kenro Aihara,
PY - 2002
KW - null
VL - 3
JA - Pattern Recognition, International Conference on
ER -
 
Atsuhiro Takasu, National Institute of Informatics
Kenro Aihara, National Institute of Informatics
This paper proposes a text recognition error model called the dual variable length output hidden Markov model (DVHMM) and gives a parameter estimation algorithm based on the EM algorithm. Although existing probabilistic error models are limited to substitution (1,1), insertion (1,0), and deletion (0,1) errors, the DVHMM can handle error patterns of any pair (i, j) of lengths including substitution, insertion, and deletion.
Citation:
Atsuhiro Takasu, Kenro Aihara, "DVHMM: Variable Length Text Recognition Error Model," icpr, vol. 3, pp.30110, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 3, 2002
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