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16th International Conference on Pattern Recognition (ICPR'02) - Volume 3
Solving the Small Sample Size Problem of LDA
Quebec City, QC, Canada
August 11-August 15
ISBN: 0-7695-1695-X
Rui Huang, Chinese Academy of Sciences
Qingshan Liu, Chinese Academy of Sciences
Hanqing Lu, Chinese Academy of Sciences
Songde Ma, Chinese Academy of Sciences
The small sample size problem is often encountered in pattern recognition. It results in the singularity of the within-class scatter matrix Sw in Linear Discriminant Analysis (LDA). Different methods have been proposed to solve this problem in face recognition literature. Some methods reduce the dimension of the original sample space and hence unavoidably remove the null space of Sw, which has been demonstrated to contain considerable discriminative information; whereas other methods suffer from the computational problem. In this paper, we propose a new method to make use of the null space of Sw effectively and solve the small sample size problem of LDA. We compare our method with several well-known methods, and demonstrate the efficiency of our method.
Citation:
Rui Huang, Qingshan Liu, Hanqing Lu, Songde Ma, "Solving the Small Sample Size Problem of LDA," icpr, vol. 3, pp.30029, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 3, 2002
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