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16th International Conference on Pattern Recognition (ICPR'02) - Volume 4
Linear and Non-Linear Model for Statistical Localization of Landmarks
Quebec City, QC, Canada
August 11-August 15
ISBN: 0-7695-1695-X
ASCII Text
x 
 
B. Romaniuk, M. Desvignes, M. Revenu, M. J. Deshayes, "Linear and Non-Linear Model for Statistical Localization of Landmarks," Pattern Recognition, International Conference on, vol. 4, pp. 40393, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 4, 2002.
 
 
BibTex
x
 
@article{ 10.1109/ICPR.2002.1047478,
author = {B. Romaniuk and M. Desvignes and M. Revenu and M. J. Deshayes},
title = {Linear and Non-Linear Model for Statistical Localization of Landmarks},
journal ={Pattern Recognition, International Conference on},
volume = {4},
year = {2002},
issn = {1051-4651},
pages = {40393},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2002.1047478},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Pattern Recognition, International Conference on
TI - Linear and Non-Linear Model for Statistical Localization of Landmarks
SN - 1051-4651
SP
EP
A1 - B. Romaniuk,
A1 - M. Desvignes,
A1 - M. Revenu,
A1 - M. J. Deshayes,
PY - 2002
KW - null
VL - 4
JA - Pattern Recognition, International Conference on
ER -
 
B. Romaniuk, GREYC-CNRS
M. Desvignes, GREYC-CNRS
M. Revenu, GREYC-CNRS
M. J. Deshayes, GREYC-CNRS
This paper presents and compares 3 methods for the statistical localization of partially occulted landmarks. In many real applications, some information is visible in images and some parts are missing or occulted. These parts are estimated by 3 statistical approaches : a rigid registration, a linear method derived from PCA, which represents spatial relationships, and a non linear model based upon Kernel PCA. Applied to the cephalometric problem, the best method exhibits a mean error of 3.3mm, which is about 3 times the intra-expert variability.
Citation:
B. Romaniuk, M. Desvignes, M. Revenu, M. J. Deshayes, "Linear and Non-Linear Model for Statistical Localization of Landmarks," icpr, vol. 4, pp.40393, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 4, 2002
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