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16th International Conference on Pattern Recognition (ICPR'02) - Volume 4
Uniformity Testing Using Minimal Spanning Tree
Quebec City, QC, Canada
August 11-August 15
ISBN: 0-7695-1695-X
Anil. K. Jain, Michigan State University
Xiaowei Xu, Michigan State University
Tin Kam Ho, Bell Laboratories, Lucent Technologies
Fan Xiao, Michigan State University
Testing for uniformity of multivariate data is the initial step in exploratory pattern analysis. We propose a new uniformity testing method, which first computes the maximum (standardized) edge length in the MST of the given data. Large lengths indicate the existence of well-separated clusters or outliers in the data. For the data passing this edge inconsistency test, we generate two sub-samples of the data by a weighted resampling method, where the weights are computed based on the normalized edge lengths of MST of the entire data. The uniformity of the data is estimated by running the two-sample MST-test on these two subsamples. Experiments with simulated and real data show the potential of the proposed test in identifying uniform or weakly clustered data. This test can also be used to rank various data sets based on their degree of uniformity.
Citation:
Anil. K. Jain, Xiaowei Xu, Tin Kam Ho, Fan Xiao, "Uniformity Testing Using Minimal Spanning Tree," icpr, vol. 4, pp.40281, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 4, 2002
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