loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
16th International Conference on Pattern Recognition (ICPR'02) - Volume 1
Classifying Land Development in High Resolution Satellite Images Using Straight Line Statistics
Quebec City, QC, Canada
August 11-August 15
ISBN: 0-7695-1695-X
Cem Ünsalan, Ohio State University
Kim L. Boyer, Ohio State University
We introduce a set of measures based on straight lines to assess land development levels in high resolution (1 meter) satellite images. Urban areas exhibit a preponderance of straight line features, generally appearing in fairly simple, quasiperiodic organizations. Wilderness and rural areas produce line structures in more random spatial arrangements. We use this observation to perform an initial triage on the image to restrict the attention of subsequent, more computationally intensive analyses. We extract statistical measures based on straight lines to guide the analysis. We base these measures on orientation, length, contrast, periodicity and location. We trained and tested parametric and non-parametric classifiers using the feature set. Finally, we introduce a decision system performing region classification via an overlapped voting method for consensus discovery.
Citation:
Cem Ünsalan, Kim L. Boyer, "Classifying Land Development in High Resolution Satellite Images Using Straight Line Statistics," icpr, vol. 1, pp.10127, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 1, 2002
Usage of this product signifies your acceptance of the Terms of Use.