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15th International Conference on Pattern Recognition (ICPR'00) - Volume 2
Signature Verification using Fractal Transformation
Barcelona, Spain
September 03-September 08
ISBN: 0-7695-0750-6
ASCII Text
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Kai Huang, Hong Yan, "Signature Verification using Fractal Transformation," Pattern Recognition, International Conference on, vol. 2, pp. 2851, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 2, 2000.
 
 
BibTex
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@article{ 10.1109/ICPR.2000.906208,
author = {Kai Huang and Hong Yan},
title = {Signature Verification using Fractal Transformation},
journal ={Pattern Recognition, International Conference on},
volume = {2},
year = {2000},
isbn = {0-7695-0750-6},
pages = {2851},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2000.906208},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Pattern Recognition, International Conference on
TI - Signature Verification using Fractal Transformation
SN - 0-7695-0750-6
SP
EP
A1 - Kai Huang,
A1 - Hong Yan,
PY - 2000
VL - 2
JA - Pattern Recognition, International Conference on
ER -
 
Kai Huang, University of Sydney
Hong Yan, University of Sydney and City University of Hong Kong
This paper presents a fractal transformation based technique for signature verification. In this method, the fractal code of the reference signature locus is applied to a test signature locus and a sequence of fractal decoded test loci is obtained. The successive distances between the decoded tests, loci transforming towards the fractal attractor are compared to those obtained from the genuine reference signatures. The verification decision is derived from the rate of change of these distances. The experiment shows that the current implementation of the fractal transformation based verification algorithm is effective for random forgery detection.
Citation:
Kai Huang, Hong Yan, "Signature Verification using Fractal Transformation," icpr, vol. 2, pp.2851, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 2, 2000
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