Keun-Chung Kim, Doo-Young Kim, J K Aggarwal, "Feature Extraction of Edge by Directional Computation of Gray-Scale Variation," Pattern Recognition, International Conference on, vol. 2, pp. 1022, 14th International Conference on Pattern Recognition (ICPR'98) - Volume 2, 1998.

@article{ 10.1109/ICPR.1998.711863,
author = {Keun-Chung Kim and Doo-Young Kim and J K Aggarwal},
title = {Feature Extraction of Edge by Directional Computation of Gray-Scale Variation},
journal ={Pattern Recognition, International Conference on},
volume = {2},
year = {1998},
issn = {1051-4651},
pages = {1022},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.1998.711863},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Pattern Recognition, International Conference on
TI - Feature Extraction of Edge by Directional Computation of Gray-Scale Variation
SN - 1051-4651
SP
EP
A1 - Keun-Chung Kim,
A1 - Doo-Young Kim,
A1 - J K Aggarwal,
PY - 1998
VL - 2
JA - Pattern Recognition, International Conference on
ER -