Bin Luo, A D J Cross, E R Hancock, "Corner Detection Using Vector Potential," Pattern Recognition, International Conference on, vol. 2, pp. 1018, 14th International Conference on Pattern Recognition (ICPR'98) - Volume 2, 1998.

@article{ 10.1109/ICPR.1998.711862,
author = {Bin Luo and A D J Cross and E R Hancock},
title = {Corner Detection Using Vector Potential},
journal ={Pattern Recognition, International Conference on},
volume = {2},
year = {1998},
issn = {1051-4651},
pages = {1018},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.1998.711862},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Pattern Recognition, International Conference on
TI - Corner Detection Using Vector Potential
SN - 1051-4651
SP
EP
A1 - Bin Luo,
A1 - A D J Cross,
A1 - E R Hancock,
PY - 1998
VL - 2
JA - Pattern Recognition, International Conference on
ER -