H. Wu, Q. Chen, M. Yachida, "Facial Feature Extraction and Face Verification," Pattern Recognition, International Conference on, vol. 3, pp. 484, 13th International Conference on Pattern Recognition (ICPR'96) - Volume 3, 1996.

@article{ 10.1109/ICPR.1996.546994,
author = {H. Wu and Q. Chen and M. Yachida},
title = {Facial Feature Extraction and Face Verification},
journal ={Pattern Recognition, International Conference on},
volume = {3},
year = {1996},
issn = {1051-4651},
pages = {484},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.1996.546994},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Pattern Recognition, International Conference on
TI - Facial Feature Extraction and Face Verification
SN - 1051-4651
SP
EP
A1 - H. Wu,
A1 - Q. Chen,
A1 - M. Yachida,
PY - 1996
VL - 3
JA - Pattern Recognition, International Conference on
ER -