loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
2007 International Conference on Parallel Processing (ICPP 2007)
Multi-Layer Event Trace Analysis for Parallel I/O Performance Tuning
Xi'an, China
September 10-September 14
ISBN: 0-7695-2933-X
Pin Lu, University of Rochester, USA
Kai Shen, University of Rochester, USA
The complexity of parallel I/O systems lies in the deep I/O stack with many software layers and concurrent I/O request handling at multiple layers. This paper explores multi-layer event tracing and analysis to pinpoint the system layers responsible for performance problems. Our approach follows two principles: 1) collect generic (layer-independent) events and I/O characteristics to ease the analysis on cross-layer I/O characteristics evolution; 2) perform bottom-up trace analysis to take advantage of the relatively easy anomaly identification at lower system layers. Our empirical case study discovered root causes for several anomalous performance behaviors of MPI-IO applications running on a parallel file system. First, we detect an anomaly with the asynchronous I/O implementation in the GNU C runtime library. Additionally, we find that concurrent I/O from multiple MPI processes may induce frequent disk seek/rotation and thus degrade the I/O efficiency. We also point out that lack of asynchronous support at the parallel file system client side may result in inefficiency for fine-grained writes. Using an aggressive I/O prefetching strategy and a corrected asynchronous I/O implementation, we achieve 39-156% read I/O throughput improvement for four out of five applications that we experimented.
Citation:
Pin Lu, Kai Shen, "Multi-Layer Event Trace Analysis for Parallel I/O Performance Tuning," icpp, pp.12, 2007 International Conference on Parallel Processing (ICPP 2007), 2007
Usage of this product signifies your acceptance of the Terms of Use.