Third International Conference on Systems (icons 2008) Regularized Structured Total Least Norm for the Identification of Bilinear Systems in the Errors-in-Variables Framework April 13-April 18 ISBN: 978-0-7695-3105-2
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICONS.2008.71
The paper addresses the identification of time-invariant bilinear system (BS) models in the errors-in-variables (EIV) framework. The proposed scheme is based on the structured total least norm (STLN) technique extended here to handle BS. The performance of the presented approach, i.e. the bilinear STLN (BSTLN) with its further extension incorporating the Tikhonov regularization is compared to several other EIV identification techniques via an extensive Monte-Carlo simulation study. The results obtained demonstrate a considerable noise robustness and, therefore, the applicability of the BSTLN algorithm in the EIV framework.
Index Terms:
Bilinear systems, Errors-in-variables, Identification, Regularization, Total least norm
Citation:
Tomasz Larkowski, Jens G. Linden, Benoit Vinsonneau, Keith J. Burnham, "Regularized Structured Total Least Norm for the Identification of Bilinear Systems in the Errors-in-Variables Framework," icons, pp.128-133, Third International Conference on Systems (icons 2008), 2008 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||