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Third International Conference on Systems (icons 2008)
Non-destructive Evaluation and Flaw Visualization Using an Eddy Current Probe
April 13-April 18
ISBN: 978-0-7695-3105-2
ASCII Text
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Rafic Bachnak, Scott King, "Non-destructive Evaluation and Flaw Visualization Using an Eddy Current Probe," Systems, Second International Conference on, pp. 134-139, Third International Conference on Systems (icons 2008), 2008.
 
 
BibTex
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@article{ 10.1109/ICONS.2008.61,
author = {Rafic Bachnak and Scott King},
title = {Non-destructive Evaluation and Flaw Visualization Using an Eddy Current Probe},
journal ={Systems, Second International Conference on},
volume = {0},
year = {2008},
isbn = {978-0-7695-3105-2},
pages = {134-139},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICONS.2008.61},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Systems, Second International Conference on
TI - Non-destructive Evaluation and Flaw Visualization Using an Eddy Current Probe
SN - 978-0-7695-3105-2
SP134
EP139
A1 - Rafic Bachnak,
A1 - Scott King,
PY - 2008
KW - null
VL - 0
JA - Systems, Second International Conference on
ER -
 
This paper describes the development of an eddy current prototype that combines positional and eddy-current data to produce a C-scan of tested material. The preliminary system consists of an eddy current probe, a position tracking mechanism, and basic data visualization capability. Test results of the prototype are presented and briefly discussed.
Citation:
Rafic Bachnak, Scott King, "Non-destructive Evaluation and Flaw Visualization Using an Eddy Current Probe," icons, pp.134-139, Third International Conference on Systems (icons 2008), 2008
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