Seventh IEEE/ACIS International Conference on Computer and Information Science (icis 2008) Machine Learning Approach for Ontology Mapping Using Multiple Concept Similarity Measures May 14-May 16 ISBN: 978-0-7695-3131-1
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICIS.2008.51
This paper presents a new framework for the ontology mapping problem. We organized the ontology mapping problem into a standard machine learning framework, which uses multiple concept similarity measures. We presented several concept similarity measures for the machine learning framework and conducted experiments for testing the framework using real-world data. Our experimental results show that our approach has increased performance with respect to precision, recall and F-measure in comparison with other methods.
Index Terms:
machine learning, ontology mapping, semantic integration, semantic web
Citation:
Ryutaro Ichise, "Machine Learning Approach for Ontology Mapping Using Multiple Concept Similarity Measures," icis, pp.340-346, Seventh IEEE/ACIS International Conference on Computer and Information Science (icis 2008), 2008 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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