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First International Conference on Innovative Computing, Information and Control - Volume II (ICICIC'06)
Pattern Recognition Based on Relative Position of Local Features Using Self-Organizing Map
Beijing, China
August 30-September 01
ISBN: 0-7695-2616-0
Keiichi Horio, Kyushu Institute of Technology, Japan
Akira Aikawa, Kyushu Institute of Technology, Japan
Takeshi Yamakawa, Kyushu Institute of Technology, Japan
In this paper, we propose a new pattern recognition method based on relative position of local feature. In the visual system of human, the local features such as lines and curves are extracted, and they are integrated. In the proposed method, relative position of the gazing points which include local features are extracted using self-organizing map. A template matching concerning the local features are used for recognizing the patterns. The effectiveness of the proposed method is verified by applying it to MNIST handwritten digits database.
Citation:
Keiichi Horio, Akira Aikawa, Takeshi Yamakawa, "Pattern Recognition Based on Relative Position of Local Features Using Self-Organizing Map," icicic, vol. 2, pp.293-296, First International Conference on Innovative Computing, Information and Control - Volume II (ICICIC'06), 2006
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