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First International Conference on Innovative Computing, Information and Control - Volume I (ICICIC'06)
Measurements and Improvements of Conducted Electromagnetic Interference Emission Caused by the Switching Circuit
Beijing, China
August 30-September 01
ISBN: 0-7695-2616-0
ASCII Text
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Yuh-Yih Lu, Zhi-Hua Chen, Chung-Hsiung Yeh, Hsiang-Cheh Huang, "Measurements and Improvements of Conducted Electromagnetic Interference Emission Caused by the Switching Circuit," Innovative Computing ,Information and Control, International Conference on, vol. 1, pp. 113-116, First International Conference on Innovative Computing, Information and Control - Volume I (ICICIC'06), 2006.
 
 
BibTex
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@article{ 10.1109/ICICIC.2006.113,
author = {Yuh-Yih Lu and Zhi-Hua Chen and Chung-Hsiung Yeh and Hsiang-Cheh Huang},
title = {Measurements and Improvements of Conducted Electromagnetic Interference Emission Caused by the Switching Circuit},
journal ={Innovative Computing ,Information and Control, International Conference on},
volume = {1},
year = {2006},
isbn = {0-7695-2616-0},
pages = {113-116},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICICIC.2006.113},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Innovative Computing ,Information and Control, International Conference on
TI - Measurements and Improvements of Conducted Electromagnetic Interference Emission Caused by the Switching Circuit
SN - 0-7695-2616-0
SP113
EP116
A1 - Yuh-Yih Lu,
A1 - Zhi-Hua Chen,
A1 - Chung-Hsiung Yeh,
A1 - Hsiang-Cheh Huang,
PY - 2006
KW - null
VL - 1
JA - Innovative Computing ,Information and Control, International Conference on
ER -
 
Yuh-Yih Lu, Minghsin University of Science and Technology, Taiwan, R.O.C.
Zhi-Hua Chen, Minghsin University of Science and Technology, Taiwan, R.O.C.
Chung-Hsiung Yeh, Minghsin University of Science and Technology, Taiwan, R.O.C.
Hsiang-Cheh Huang, National University of Kaohsiung, Taiwan, R.O.C.
In general, the conducted electromagnetic interference (EMI) emission exists in most of the electronic products and affects the electromagnetic environments. In this paper, we design a switching circuit to observe and improve the conducted EMI emission. We also discuss the conducted EMI effects with putting RC snubber or diode into the switching circuit. It is found that the switching circuits with RC snubber or diode can reduce the conducted EMI effect and accord with the limitations of FCC Part 15 Class B and EN 55011 Class B.
Citation:
Yuh-Yih Lu, Zhi-Hua Chen, Chung-Hsiung Yeh, Hsiang-Cheh Huang, "Measurements and Improvements of Conducted Electromagnetic Interference Emission Caused by the Switching Circuit," icicic, vol. 1, pp.113-116, First International Conference on Innovative Computing, Information and Control - Volume I (ICICIC'06), 2006
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