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Sixth IEEE International Conference on Data Mining - Workshops (ICDMW'06)
Enhancing Reliability throughout Knowledge Discovery Process
Hong Kong, China
December 18-December 22
ISBN: 0-7695-2702-7
ASCII Text
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Yi Feng, Zhaohui Wu, "Enhancing Reliability throughout Knowledge Discovery Process," Data Mining Workshops, International Conference on, pp. 754-758, Sixth IEEE International Conference on Data Mining - Workshops (ICDMW'06), 2006.
 
 
BibTex
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@article{ 10.1109/ICDMW.2006.70,
author = {Yi Feng and Zhaohui Wu},
title = {Enhancing Reliability throughout Knowledge Discovery Process},
journal ={Data Mining Workshops, International Conference on},
volume = {0},
year = {2006},
isbn = {0-7695-2702-7},
pages = {754-758},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICDMW.2006.70},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Data Mining Workshops, International Conference on
TI - Enhancing Reliability throughout Knowledge Discovery Process
SN - 0-7695-2702-7
SP754
EP758
A1 - Yi Feng,
A1 - Zhaohui Wu,
PY - 2006
KW - null
VL - 0
JA - Data Mining Workshops, International Conference on
ER -
 
Yi Feng, Zhejiang University, Hangzhou 310027, P.R.China
Zhaohui Wu, Zhejiang University, Hangzhou 310027, P.R.China
Reliability is a key issue in knowledge discovery. However, this topic is not fully explored in data mining community. This paper takes a process perspective towards the reliability of knowledge discovery, and the reliability of extracted knowledge is evaluated by the reliability of whole knowledge discovery process. To describe the relationship between the final reliability and the reliability in each stage of process, a reliability model for generic knowledge process is proposed, and is further extended to the context of CRoss-Industry Standard Process for Data Mining (CRISP-DM). Moreover, eight factors contributing to knowledge discovery reliability are presented in the order of six phases in CRISP-DM. Based on these factors, ten suggestions on how to enhance reliability throughout knowledge discovery process are provided.
Citation:
Yi Feng, Zhaohui Wu, "Enhancing Reliability throughout Knowledge Discovery Process," icdmw, pp.754-758, Sixth IEEE International Conference on Data Mining - Workshops (ICDMW'06), 2006
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