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Sixth IEEE International Conference on Data Mining - Workshops (ICDMW'06)
Preserving Private Knowledge in Frequent Pattern Mining
Hong Kong, China
December 18-December 22
ISBN: 0-7695-2702-7
ASCII Text
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Zhihui Wang, Wei Wang, Baile Shi, S. H. Boey, "Preserving Private Knowledge in Frequent Pattern Mining," Data Mining Workshops, International Conference on, pp. 530-534, Sixth IEEE International Conference on Data Mining - Workshops (ICDMW'06), 2006.
 
 
BibTex
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@article{ 10.1109/ICDMW.2006.132,
author = {Zhihui Wang and Wei Wang and Baile Shi and S. H. Boey},
title = {Preserving Private Knowledge in Frequent Pattern Mining},
journal ={Data Mining Workshops, International Conference on},
volume = {0},
year = {2006},
isbn = {0-7695-2702-7},
pages = {530-534},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICDMW.2006.132},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Data Mining Workshops, International Conference on
TI - Preserving Private Knowledge in Frequent Pattern Mining
SN - 0-7695-2702-7
SP530
EP534
A1 - Zhihui Wang,
A1 - Wei Wang,
A1 - Baile Shi,
A1 - S. H. Boey,
PY - 2006
KW - null
VL - 0
JA - Data Mining Workshops, International Conference on
ER -
 
Zhihui Wang, Fudan University, China
Wei Wang, Fudan University, China
Baile Shi, Fudan University, China
S. H. Boey, Gentec Pte Ltd., Singapore
The knowledge discovered by data mining may contain sensitive information, which may cause potential threats towards privacy and security. In this paper, we address the problem of better preserving private knowledge by proposing an Item-based Pattern Sanitization to prevent the disclosure of private patterns. We also present two strategies to generate a safe and shareable pattern set for preserving private knowledge in frequent pattern mining.
Citation:
Zhihui Wang, Wei Wang, Baile Shi, S. H. Boey, "Preserving Private Knowledge in Frequent Pattern Mining," icdmw, pp.530-534, Sixth IEEE International Conference on Data Mining - Workshops (ICDMW'06), 2006
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