loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Sixth IEEE International Conference on Data Mining (ICDM'06)
How Bayesians Debug
Hong Kong
December 18-December 22
ISBN: 0-7695-2701-9
Chao Liu, University of Illinois-UC, USA
Zeng Lian, Brigham Young University, USA
Jiawei Han, University of Illinois-UC, USA
Manual debugging is expensive. And the high cost has motivated extensive research on automated fault lo- calization in both software engineering and data mining communities. Fault localization aims at automatically locating likely fault locations, and hence assists manual debugging. A number of fault localization algorithms have been developed in recent years, which prove effec- tive when multiple failing and passing cases are avail- able. However, we notice what is more commonly en- countered in practice is the two-sample debugging prob- lem, where only one failing and one passing cases are available. This problem has been either overlooked or insufficiently tackled in previous studies.

In this paper, we develop a new fault localization al- gorithm, named BayesDebug, which simulates some manual debugging principles through a Bayesian ap- proach. Different from existing approaches that base fault analysis on multiple passing and failing cases, BayesDebug only requires one passing and one failing cases. We reason about why BayesDebug fits the two- sample debugging problem and why other approaches do not. Finally, an experiment with a real-world program grep-2.2 is conducted, which exemplifies the effective- ness of BayesDebug.

Citation:
Chao Liu, Zeng Lian, Jiawei Han, "How Bayesians Debug," icdm, pp.382-393, Sixth IEEE International Conference on Data Mining (ICDM'06), 2006
Usage of this product signifies your acceptance of the Terms of Use.