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Fifth IEEE International Conference on Data Mining (ICDM'05) Semi-Supervised Clustering with Metric Learning Using Relative Comparisons Houston, Texas November 27-November 30 ISBN: 0-7695-2278-5
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICDM.2005.128
Semi-supervised clustering algorithms partition a given data set using limited supervision from the user. In this paper, we propose a clustering algorithmthat uses supervision in terms of relative comparisons, viz., is closer to than to . The success of a clustering algorithm also depends on the kind of dissimilarity measure. The proposed clustering algorithm learns the underlying dissimilarity measure while finding compact clusters in the given data set. Through our experimental studies on high-dimensional textual data sets, we demonstrate that the proposed algorithm achieves higher accuracy than the algorithms using pairwise constraints for supervision.
Citation:
Nimit Kumar, Krishna Kummamuru, Deepa Paranjpe, "Semi-Supervised Clustering with Metric Learning Using Relative Comparisons," icdm, pp.693-696, Fifth IEEE International Conference on Data Mining (ICDM'05), 2005 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||