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Third IEEE International Conference on Data Mining (ICDM'03)
Text Mining for a Clear Picture of Defect Reports: A Praxis Report
Melbourne, Florida
November 19-November 22
ISBN: 0-7695-1978-4
ASCII Text
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Jutta Kreyss, Steve Selvaggio, Michael White, Zach Zakharian, "Text Mining for a Clear Picture of Defect Reports: A Praxis Report," Data Mining, IEEE International Conference on, pp. 727, Third IEEE International Conference on Data Mining (ICDM'03), 2003.
 
 
BibTex
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@article{ 10.1109/ICDM.2003.1251018,
author = {Jutta Kreyss and Steve Selvaggio and Michael White and Zach Zakharian},
title = {Text Mining for a Clear Picture of Defect Reports: A Praxis Report},
journal ={Data Mining, IEEE International Conference on},
volume = {0},
year = {2003},
isbn = {0-7695-1978-4},
pages = {727},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICDM.2003.1251018},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Data Mining, IEEE International Conference on
TI - Text Mining for a Clear Picture of Defect Reports: A Praxis Report
SN - 0-7695-1978-4
SP
EP
A1 - Jutta Kreyss,
A1 - Steve Selvaggio,
A1 - Michael White,
A1 - Zach Zakharian,
PY - 2003
KW - null
VL - 0
JA - Data Mining, IEEE International Conference on
ER -
 
Jutta Kreyss, IBM Deutschland Entwicklung
Steve Selvaggio, IBM Silicon Valley Laboratory
Michael White, IBM Silicon Valley Laboratory
Zach Zakharian, IBM Silicon Valley Laboratory
We applied the text mining categorization technology, in the publicly available, IBM Enterprise Information Portal V8.1 to more than 15,000 customer reported, product problem records. We used a proven software quality category set to categorize these problem records into different areas of interest. Our intent was to develop a clear picture of potential areas for quality improvement in each of the software products reviewed, and to provide this information to development?s management.
The paper presents the benefits that can be gained from categorizing problem records, as well as the limitations.
Citation:
Jutta Kreyss, Steve Selvaggio, Michael White, Zach Zakharian, "Text Mining for a Clear Picture of Defect Reports: A Praxis Report," icdm, pp.727, Third IEEE International Conference on Data Mining (ICDM'03), 2003
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