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First IEEE International Conference on Data Mining (ICDM'01)
A Tight Upper Bound on the Number of Candidate Patterns
San Jose, California
November 29-December 02
ISBN: 0-7695-1119-8
ASCII Text
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Flores Geerts, Bart Goethals, Jan Van den Bussche, "A Tight Upper Bound on the Number of Candidate Patterns," Data Mining, IEEE International Conference on, pp. 155, First IEEE International Conference on Data Mining (ICDM'01), 2001.
 
 
BibTex
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@article{ 10.1109/ICDM.2001.989513,
author = {Flores Geerts and Bart Goethals and Jan Van den Bussche},
title = {A Tight Upper Bound on the Number of Candidate Patterns},
journal ={Data Mining, IEEE International Conference on},
volume = {0},
year = {2001},
isbn = {0-7695-1119-8},
pages = {155},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICDM.2001.989513},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Data Mining, IEEE International Conference on
TI - A Tight Upper Bound on the Number of Candidate Patterns
SN - 0-7695-1119-8
SP
EP
A1 - Flores Geerts,
A1 - Bart Goethals,
A1 - Jan Van den Bussche,
PY - 2001
VL - 0
JA - Data Mining, IEEE International Conference on
ER -
 
In the context of mining for frequent patterns using the standard level wise algorithm, the following question arises: given the current level and the current set of frequent patterns, what is the maximal number of candidate patterns that can be generated on the next level? We answer this question by providing a tight upper bound, derived from a combinatorial result from the sixties by Kruskal and Katona. Our result is useful to educe the number of database scans.
Citation:
Flores Geerts, Bart Goethals, Jan Van den Bussche, "A Tight Upper Bound on the Number of Candidate Patterns," icdm, pp.155, First IEEE International Conference on Data Mining (ICDM'01), 2001
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