Optimized Sequential Pattern Mining from Point Of Sales Data

I
ICDEW
2005
21st International Conference on Data Engineering Workshops (ICDEW'05)
Abstract - Optimized Sequential Pattern Mining from Point Of Sales Data

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21st International Conference on Data Engineering Workshops (ICDEW'05)

Tokyo, Japan

April 05-April 08

ISBN: 0-7695-2657-8

	ASCII Text	x
	Kazumitsu Yagi, Mai Soramoto, Miho Mokuda, Yasuhiko Morimoto, "Optimized Sequential Pattern Mining from Point Of Sales Data," Data Engineering Workshops, 22nd International Conference on, pp. 1223, 21st International Conference on Data Engineering Workshops (ICDEW'05), 2005.

	BibTex	x
	@article{ 10.1109/ICDE.2005.257, author = {Kazumitsu Yagi and Mai Soramoto and Miho Mokuda and Yasuhiko Morimoto}, title = {Optimized Sequential Pattern Mining from Point Of Sales Data}, journal ={Data Engineering Workshops, 22nd International Conference on}, volume = {0}, year = {2005}, isbn = {0-7695-2657-8}, pages = {1223}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICDE.2005.257}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Data Engineering Workshops, 22nd International Conference on TI - Optimized Sequential Pattern Mining from Point Of Sales Data SN - 0-7695-2657-8 SP EP A1 - Kazumitsu Yagi, A1 - Mai Soramoto, A1 - Miho Mokuda, A1 - Yasuhiko Morimoto, PY - 2005 KW - null VL - 0 JA - Data Engineering Workshops, 22nd International Conference on ER -

Kazumitsu Yagi, Hiroshima University

Mai Soramoto, Hiroshima University

Miho Mokuda, Hiroshima University

Yasuhiko Morimoto, Hiroshima University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICDE.2005.257

We consider an optimization problem of sequential pattern mining. We present space efficient algorithms for computing optimized sequential pattern that maximize transitive confidence from a cause event to an effect event. Those can compute optimized sequential patterns for all cause-effect pairs of sales fluctuation events in large POS data.

Citation:

Kazumitsu Yagi, Mai Soramoto, Miho Mokuda, Yasuhiko Morimoto, "Optimized Sequential Pattern Mining from Point Of Sales Data," icdew, pp.1223, 21st International Conference on Data Engineering Workshops (ICDEW'05), 2005

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