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21st International Conference on Data Engineering Workshops (ICDEW'05)
Optimized Sequential Pattern Mining from Point Of Sales Data
Tokyo, Japan
April 05-April 08
ISBN: 0-7695-2657-8
ASCII Text
x 
 
Kazumitsu Yagi, Mai Soramoto, Miho Mokuda, Yasuhiko Morimoto, "Optimized Sequential Pattern Mining from Point Of Sales Data," Data Engineering Workshops, 22nd International Conference on, pp. 1223, 21st International Conference on Data Engineering Workshops (ICDEW'05), 2005.
 
 
BibTex
x
 
@article{ 10.1109/ICDE.2005.257,
author = {Kazumitsu Yagi and Mai Soramoto and Miho Mokuda and Yasuhiko Morimoto},
title = {Optimized Sequential Pattern Mining from Point Of Sales Data},
journal ={Data Engineering Workshops, 22nd International Conference on},
volume = {0},
year = {2005},
isbn = {0-7695-2657-8},
pages = {1223},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICDE.2005.257},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Data Engineering Workshops, 22nd International Conference on
TI - Optimized Sequential Pattern Mining from Point Of Sales Data
SN - 0-7695-2657-8
SP
EP
A1 - Kazumitsu Yagi,
A1 - Mai Soramoto,
A1 - Miho Mokuda,
A1 - Yasuhiko Morimoto,
PY - 2005
KW - null
VL - 0
JA - Data Engineering Workshops, 22nd International Conference on
ER -
 
Kazumitsu Yagi, Hiroshima University
Mai Soramoto, Hiroshima University
Miho Mokuda, Hiroshima University
Yasuhiko Morimoto, Hiroshima University
We consider an optimization problem of sequential pattern mining. We present space efficient algorithms for computing optimized sequential pattern that maximize transitive confidence from a cause event to an effect event. Those can compute optimized sequential patterns for all cause-effect pairs of sales fluctuation events in large POS data.
Citation:
Kazumitsu Yagi, Mai Soramoto, Miho Mokuda, Yasuhiko Morimoto, "Optimized Sequential Pattern Mining from Point Of Sales Data," icdew, pp.1223, 21st International Conference on Data Engineering Workshops (ICDEW'05), 2005
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