Quality Transition Fault Tests Suitable for Small Delay Defects

I
ICCD
2005
2005 International Conference on Computer Design
Abstract - Quality Transition Fault Tests Suitable for Small Delay Defects

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	Similar Articles Articles by M.M. Vaseekar Kumar Articles by S. Tragoudas

2005 International Conference on Computer Design

San Jose, California

October 02-October 05

ISBN: 0-7695-2451-6

	ASCII Text	x
	M.M. Vaseekar Kumar, S. Tragoudas, "Quality Transition Fault Tests Suitable for Small Delay Defects," Computer Design, International Conference on, pp. 468-470, 2005 International Conference on Computer Design, 2005.

	BibTex	x
	@article{ 10.1109/ICCD.2005.88, author = {M.M. Vaseekar Kumar and S. Tragoudas}, title = {Quality Transition Fault Tests Suitable for Small Delay Defects}, journal ={Computer Design, International Conference on}, volume = {0}, year = {2005}, isbn = {0-7695-2451-6}, pages = {468-470}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2005.88}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Computer Design, International Conference on TI - Quality Transition Fault Tests Suitable for Small Delay Defects SN - 0-7695-2451-6 SP468 EP470 A1 - M.M. Vaseekar Kumar, A1 - S. Tragoudas, PY - 2005 KW - null VL - 0 JA - Computer Design, International Conference on ER -

M.M. Vaseekar Kumar, Department of Electrical and Computer Engineering, Southern Illinois University Carbondale, IL

S. Tragoudas, Department of Electrical and Computer Engineering, Southern Illinois University Carbondale, IL

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICCD.2005.88

Compact high quality test sets to detect small delay defects can be generated using the transition fault model by insisting that events are activated and propagated only along the critical paths for each transition fault, implicitly kept in a zero-suppressed binary decision diagram. This paper shows how to implicitly generate test functions for the described high quality transition fault model. The novelty of the method relies on a multivalued algebra that is used to generate the test functions with a single circuit traversal.

Citation:

M.M. Vaseekar Kumar, S. Tragoudas, "Quality Transition Fault Tests Suitable for Small Delay Defects," iccd, pp.468-470, 2005 International Conference on Computer Design, 2005

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