A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals

I
ICCD
2005
2005 International Conference on Computer Design
Abstract - A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals

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	Similar Articles Articles by N. Devtaprasanna Articles by A. Gunda Articles by P. Krishnamurthy Articles by S.M. Reddy Articles by I. Pomeranz

2005 International Conference on Computer Design

San Jose, California

October 02-October 05

ISBN: 0-7695-2451-6

	ASCII Text	x
	N. Devtaprasanna, A. Gunda, P. Krishnamurthy, S.M. Reddy, I. Pomeranz, "A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals," Computer Design, International Conference on, pp. 471-474, 2005 International Conference on Computer Design, 2005.

	BibTex	x
	@article{ 10.1109/ICCD.2005.13, author = {N. Devtaprasanna and A. Gunda and P. Krishnamurthy and S.M. Reddy and I. Pomeranz}, title = {A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals}, journal ={Computer Design, International Conference on}, volume = {0}, year = {2005}, isbn = {0-7695-2451-6}, pages = {471-474}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2005.13}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Computer Design, International Conference on TI - A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals SN - 0-7695-2451-6 SP471 EP474 A1 - N. Devtaprasanna, A1 - A. Gunda, A1 - P. Krishnamurthy, A1 - S.M. Reddy, A1 - I. Pomeranz, PY - 2005 KW - null VL - 0 JA - Computer Design, International Conference on ER -

N. Devtaprasanna, Department of ECE, University of Iowa, Iowa City, IA

A. Gunda, LSI Logic Corp., Milpitas, CA

P. Krishnamurthy, LSI Logic Corp., Milpitas, CA 95035

S.M. Reddy, Department of ECE, University of Iowa, Iowa City, IA

I. Pomeranz, School of ECE, Purdue University, West Lafayette, IN

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICCD.2005.13

We propose a novel delay test method for achieving higher delay fault coverage. Multiple scan enable signals are used none of which require the ability to switch at-speed between launch and capture cycles.

Citation:

N. Devtaprasanna, A. Gunda, P. Krishnamurthy, S.M. Reddy, I. Pomeranz, "A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals," iccd, pp.471-474, 2005 International Conference on Computer Design, 2005

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